| Module | Title | LV Type | CP | LV | Dates | Examination |
|---|---|---|---|---|---|---|
| Beugungs- und Streumethoden | Einführung in die Röntgen-, Neutronen- und Elektronenbeugung | Fach-/Modulprüfung | 4 | 451066 | ||
| Material Analysis by Synchrotron Radiation and Neutrons | Fach-/Modulprüfung | 5 | 452096 | |||
| Material analysis by synchrotron radiation and neutrons | Vorlesung | 448633 | Mo 14:15-15:45 28A 301 (4281|301) (×12) | |||
| Material analysis by synchrotron radiation and neutrons (Tutorial) | Übung | 449716 | Mo 15:45-16:45 28A 301 (4281|301) (×11) | |||
| Einkristallmethoden | Structure Analysis of Complex Mineral and Material Phases | Fach-/Modulprüfung | 3 | 453101 | ||
| Laboratory Course X-ray Scattering | Fach-/Modulprüfung | 4 | 454049 | |||
| Structure Analysis of Complex Mineral and Material Phases (Planned as course in presence) | Vorlesung/Übung | 449564 | Mi 13:00-16:00 IFK 310, Jägerstr. 17-19 (6010|310) (×13) | |||
| From Physics Principles to the Product | From Physics Principles to the Product | Fach-/Modulprüfung | 2 | 453354 | ||
| From Physics Principles to the Product | Fach-/Modulprüfung | 2 | 452121 | |||
| Kristallzüchtung | Fundamentals and Methods of Crystal Growth | Fach-/Modulprüfung | 8 | 454050 | ||
| Methods of Crystal Growth | Übung | 447577 | Fr 08:15-11:15 IFK 310, Jägerstr. 17-19 (6010|310) (×12) | |||
| Fundamentals of Crystal Growth (Planned as course in presence) | Vorlesung | 449996 | Di 12:30-14:00 IFK 310, Jägerstr. 17-19 (6010|310) (×12) | |||
| Nano-Optics II | Nano-Optics II | Fach-/Modulprüfung | 5 | 452587 | ||
| Nano-optics II | Vorlesung/Übung | 447068 | Di 14:30-16:00 28B 110 (4282|110) (×6) Di 14:30-16:00 Online-Veranstaltung (×7) Di 16:15-17:00 28B 110 (4282|110) (×6) Di 16:15-17:00 MBP2 117 (4273|117) (×10) Di 17:00-17:45 MBP2 117 (4273|117) (×1) | |||
| Scanning Probe Microscopy | Scanning Probe Microscopy | Fach-/Modulprüfung | 5 | 451249 | ||
| Rastersondenmikroskopie (Ergänzungen für Materialwissenschaftler) | Vorlesung | 448819 | ||||
| Scanning Probe Microscopy | Vorlesung/Übung | 450169 | Mo 12:30-14:00 28B 110 (4282|110) (×13) |